Abstract
We demonstrate the role of passivation in silicon photonics photodetectors based on defect states operating in the sub bandgap regime. Upon passivation removal, higher responsivity is obtained alongside with loss reduction, surprisingly improving over time.
Original language | English |
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Title of host publication | CLEO |
Subtitle of host publication | Applications and Technology, CLEO_AT 2019 |
Publisher | Optica Publishing Group (formerly OSA) |
ISBN (Print) | 9781943580576 |
DOIs | |
State | Published - 2019 |
Event | CLEO: Applications and Technology, CLEO_AT 2019 - San Jose, United States Duration: 5 May 2019 → 10 May 2019 |
Publication series
Name | Optics InfoBase Conference Papers |
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Volume | Part F127-CLEO_AT 2019 |
ISSN (Electronic) | 2162-2701 |
Conference
Conference | CLEO: Applications and Technology, CLEO_AT 2019 |
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Country/Territory | United States |
City | San Jose |
Period | 5/05/19 → 10/05/19 |
Bibliographical note
Publisher Copyright:© 2019 The Author (s)