The role of surface passivation in integrated sub-bandgap on-chip silicon photodetectors

Rivka Gherabli, Meir Grajower, Joseph Shappir, Noa Mazurski, Uriel Levy*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We demonstrate the role of passivation in silicon photonics photodetectors based on defect states operating in the sub bandgap regime. Upon passivation removal, higher responsivity is obtained alongside with loss reduction, surprisingly improving over time.

Original languageAmerican English
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2019
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580576
DOIs
StatePublished - 2019
EventCLEO: Applications and Technology, CLEO_AT 2019 - San Jose, United States
Duration: 5 May 201910 May 2019

Publication series

NameOptics InfoBase Conference Papers
VolumePart F127-CLEO_AT 2019
ISSN (Electronic)2162-2701

Conference

ConferenceCLEO: Applications and Technology, CLEO_AT 2019
Country/TerritoryUnited States
CitySan Jose
Period5/05/1910/05/19

Bibliographical note

Publisher Copyright:
© 2019 The Author (s)

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