The Role of Surface Roughness in Plasmonically Assisted Internal Photoemission Schottky Photodetectors

Meir Grajower; Uriel Levy; Jacob B. Khurgin

The Role of Surface Roughness in Plasmonically Assisted Internal Photoemission Schottky Photodetectors

Meir Grajower, Uriel Levy, Jacob B. Khurgin

Department of Applied Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We describe the positive roll of roughness in enhancing the efficiency of internal photoemission. We show that roughness provides momentum relaxation enabling the transmission of energetic electrons through the Schottky barrier between metal and silicon.

Original language	English
Title of host publication	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781943580422
State	Published - 6 Aug 2018
Event	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States Duration: 13 May 2018 → 18 May 2018

Publication series

Name	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Conference

Conference	2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country/Territory	United States
City	San Jose
Period	13/05/18 → 18/05/18

Bibliographical note

Publisher Copyright:
© 2018 OSA.

Cite this

Grajower, M., Levy, U., & Khurgin, J. B. (2018). The Role of Surface Roughness in Plasmonically Assisted Internal Photoemission Schottky Photodetectors. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings Article 8426832 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). Institute of Electrical and Electronics Engineers Inc..

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Grajower, M, Levy, U & Khurgin, JB 2018, The Role of Surface Roughness in Plasmonically Assisted Internal Photoemission Schottky Photodetectors. in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8426832, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 13/05/18.

The Role of Surface Roughness in Plasmonically Assisted Internal Photoemission Schottky Photodetectors. / Grajower, Meir; Levy, Uriel; Khurgin, Jacob B.
2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8426832 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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PB - Institute of Electrical and Electronics Engineers Inc.

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The Role of Surface Roughness in Plasmonically Assisted Internal Photoemission Schottky Photodetectors

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