Abstract
We describe the positive roll of roughness in enhancing the efficiency of internal photoemission. We show that roughness provides momentum relaxation enabling the transmission of energetic electrons through the Schottky barrier between metal and silicon.
Original language | English |
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Title of host publication | CLEO |
Subtitle of host publication | QELS_Fundamental Science, CLEO_QELS 2018 |
Publisher | Optica Publishing Group (formerly OSA) |
ISBN (Print) | 9781943580422 |
DOIs | |
State | Published - 2018 |
Event | CLEO: QELS_Fundamental Science, CLEO_QELS 2018 - San Jose, United States Duration: 13 May 2018 → 18 May 2018 |
Publication series
Name | Optics InfoBase Conference Papers |
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Volume | Part F93-CLEO_QELS 2018 |
ISSN (Electronic) | 2162-2701 |
Conference
Conference | CLEO: QELS_Fundamental Science, CLEO_QELS 2018 |
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Country/Territory | United States |
City | San Jose |
Period | 13/05/18 → 18/05/18 |
Bibliographical note
Publisher Copyright:© OSA 2018.