Abstract
The problem of quantitative x-ray fluoroscopic analysis of traces of a heavier element in a light matrix is considered. Radiation scattered by the sample is used as an internal standard. For the restricted system under investigation, a fairly rigorous theoretical treatment is possible. A mathematical expression is derived relating the intensity of radiation at the fluorescent peak to that scattered at a chosen wavelength in its vicinity and to the concentration of trace element present. It is independent of matrix composition. On the basis of this relationship, experimental calibration curves with a wide range of applicability were prepared for Zn, Cu, Ni, Cr, and V. The accuracy of the method is tested by analyzing two samples of silicate rock of known composition.
| Original language | English |
|---|---|
| Pages (from-to) | 946-951 |
| Number of pages | 6 |
| Journal | Analytical Chemistry |
| Volume | 34 |
| Issue number | 8 |
| DOIs | |
| State | Published - Jul 1962 |
| Externally published | Yes |
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