Tight focusing of spatially variant vector optical fields with elliptical symmetry of linear polarization

Gilad M. Lerman*, Uriel Levy

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

63 Scopus citations

Abstract

We study the tight-focusing properties of spatially variant vector optical fields with elliptical symmetry of linear polarization. We found the eccentricity of the incident polarized light to be an important parameter providing an additional degree of freedom assisting in controlling the field properties at the focus and allowing matching of the field distribution at the focus to the specific application. Applications of these spacevariant polarized beams vary from lithography and optical storage to particle beam trapping and material processing.

Original languageAmerican English
Pages (from-to)2194-2196
Number of pages3
JournalOptics Letters
Volume32
Issue number15
DOIs
StatePublished - 1 Aug 2007

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