Abstract
A method of determining the complex dielectric permittivity from the quantities directly measured by the lumped-capacitance method is described. The approach is based on the relation between the charge Q(t) of the measuring condenser filled with a dielectric, an applied voltage V(t) and the dielectric response function Φ(t).
Original language | English |
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Pages (from-to) | 68-70 |
Number of pages | 3 |
Journal | Chemical Physics Letters |
Volume | 65 |
Issue number | 1 |
DOIs | |
State | Published - 1 Aug 1979 |
Externally published | Yes |