Treatment of TDS data for the lumped-capacitance method. Frequency-domain treatment

Y. D. Feldman*, V. A. Goncharov, Y. F. Zuev, V. M. Valitov

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

A method of determining the complex dielectric permittivity from the quantities directly measured by the lumped-capacitance method is described. The approach is based on the relation between the charge Q(t) of the measuring condenser filled with a dielectric, an applied voltage V(t) and the dielectric response function Φ(t).

Original languageEnglish
Pages (from-to)68-70
Number of pages3
JournalChemical Physics Letters
Volume65
Issue number1
DOIs
StatePublished - 1 Aug 1979
Externally publishedYes

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