Treatment of TDS data for the lumped-capacitance method. Frequency-domain treatment

Y. D. Feldman; V. A. Goncharov; Y. F. Zuev; V. M. Valitov

doi:10.1016/0009-2614(79)80127-X

Treatment of TDS data for the lumped-capacitance method. Frequency-domain treatment

Y. D. Feldman^*
, V. A. Goncharov
, Y. F. Zuev
, V. M. Valitov

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

A method of determining the complex dielectric permittivity from the quantities directly measured by the lumped-capacitance method is described. The approach is based on the relation between the charge Q(t) of the measuring condenser filled with a dielectric, an applied voltage V(t) and the dielectric response function Φ(t).

Original language	English
Pages (from-to)	68-70
Number of pages	3
Journal	Chemical Physics Letters
Volume	65
Issue number	1
DOIs	https://doi.org/10.1016/0009-2614(79)80127-X
State	Published - 1 Aug 1979
Externally published	Yes

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10.1016/0009-2614(79)80127-X

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@article{e6fe27639b9341eb9099470802e3c3d6,

title = "Treatment of TDS data for the lumped-capacitance method. Frequency-domain treatment",

abstract = "A method of determining the complex dielectric permittivity from the quantities directly measured by the lumped-capacitance method is described. The approach is based on the relation between the charge Q(t) of the measuring condenser filled with a dielectric, an applied voltage V(t) and the dielectric response function Φ(t).",

author = "Feldman, \{Y. D.\} and Goncharov, \{V. A.\} and Zuev, \{Y. F.\} and Valitov, \{V. M.\}",

year = "1979",

month = aug,

day = "1",

doi = "10.1016/0009-2614(79)80127-X",

language = "אנגלית",

volume = "65",

pages = "68--70",

journal = "Chemical Physics Letters",

issn = "0009-2614",

publisher = "Elsevier B.V.",

number = "1",

}

TY - JOUR

T1 - Treatment of TDS data for the lumped-capacitance method. Frequency-domain treatment

AU - Feldman, Y. D.

AU - Goncharov, V. A.

AU - Zuev, Y. F.

AU - Valitov, V. M.

PY - 1979/8/1

Y1 - 1979/8/1

N2 - A method of determining the complex dielectric permittivity from the quantities directly measured by the lumped-capacitance method is described. The approach is based on the relation between the charge Q(t) of the measuring condenser filled with a dielectric, an applied voltage V(t) and the dielectric response function Φ(t).

AB - A method of determining the complex dielectric permittivity from the quantities directly measured by the lumped-capacitance method is described. The approach is based on the relation between the charge Q(t) of the measuring condenser filled with a dielectric, an applied voltage V(t) and the dielectric response function Φ(t).

UR - https://www.scopus.com/pages/publications/49249147481

U2 - 10.1016/0009-2614(79)80127-X

DO - 10.1016/0009-2614(79)80127-X

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:49249147481

SN - 0009-2614

VL - 65

SP - 68

EP - 70

JO - Chemical Physics Letters

JF - Chemical Physics Letters

IS - 1

ER -

Treatment of TDS data for the lumped-capacitance method. Frequency-domain treatment

Abstract

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