Abstract
Angle resolved, low energy electron spectroscopy is used to study collective excitations on accumulaton layers on ZnO. As the electron density in the accumulation layer is increased a prominent loss peak is observed which, at specular reflection angles, shifts from ~ 67 meV in the absence of surface electrons to ~320 meV in strong accumulation layers. This behavior is well accounted for theoretically in terms of scattering by two-dimensional plasmon-like collective surface excitations. A shift in energy of the loss peak position as a function of δθ, the deviation angle from specular reflection, was also measured.
| Original language | English |
|---|---|
| Pages (from-to) | 355-361 |
| Number of pages | 7 |
| Journal | Surface Science |
| Volume | 113 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - 1 Jan 1982 |
| Externally published | Yes |
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