TY - JOUR
T1 - Using a wide-beam ion source to produce large area sputtered films for low-energy laboratory studies of alpha capture cross-sections
AU - Greene, John P.
AU - Wiescher, Michael C.
AU - Paul, Michael
PY - 2004/3/21
Y1 - 2004/3/21
N2 - A method for the production of well adhering thin film layers of oxide compounds was developed at Argonne National Laboratory using a wide-beam saddle field ion beam source. These deposits were to be subsequently exposed to alpha particle beams at the University of Notre Dame and the Weizmann Institute for nuclear astrophysics studies involving low-energy alpha capture cross-section measurements. The deposits produced had to be uniform, adhere well to the cooled substrates used, and withstand the high dose irradiation. A description of the apparatus, production method, and some preliminary results will be presented.
AB - A method for the production of well adhering thin film layers of oxide compounds was developed at Argonne National Laboratory using a wide-beam saddle field ion beam source. These deposits were to be subsequently exposed to alpha particle beams at the University of Notre Dame and the Weizmann Institute for nuclear astrophysics studies involving low-energy alpha capture cross-section measurements. The deposits produced had to be uniform, adhere well to the cooled substrates used, and withstand the high dose irradiation. A description of the apparatus, production method, and some preliminary results will be presented.
KW - Focused sputtering
KW - Large area target
UR - http://www.scopus.com/inward/record.url?scp=1642320751&partnerID=8YFLogxK
U2 - 10.1016/j.nima.2003.11.406
DO - 10.1016/j.nima.2003.11.406
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AN - SCOPUS:1642320751
SN - 0168-9002
VL - 521
SP - 12
EP - 16
JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
IS - 1
T2 - Accelerator Target Technology for the 21st Century. Proceeding
Y2 - 4 November 2002 through 8 November 2002
ER -