TY - GEN
T1 - Vacuity in testing
AU - Ball, Thomas
AU - Kupferman, Orna
PY - 2008
Y1 - 2008
N2 - In recent years, we see a growing awareness to the importance of assessing the quality of specifications. In the context of model checking, this can be done by analyzing the effect of applying mutations to the specification or the system. If the system satisfies the mutated specification, we know that some elements of the specification do not play a role in its satisfaction, thus the specification is satisfied in some vacuous way. If the mutated system satisfies the specification, we know that some elements of the system are not covered by the specification. Coverage in model checking has been adopted from the area of testing, where coverage information is crucial in measuring the exhaustiveness of test suits. It is now time for model checking to pay back, and let testing enjoy the rich theory and applications of vacuity. We define and study vacuous satisfaction in the context of testing, and demonstrate how vacuity analysis can lead to better specifications and test suits.
AB - In recent years, we see a growing awareness to the importance of assessing the quality of specifications. In the context of model checking, this can be done by analyzing the effect of applying mutations to the specification or the system. If the system satisfies the mutated specification, we know that some elements of the specification do not play a role in its satisfaction, thus the specification is satisfied in some vacuous way. If the mutated system satisfies the specification, we know that some elements of the system are not covered by the specification. Coverage in model checking has been adopted from the area of testing, where coverage information is crucial in measuring the exhaustiveness of test suits. It is now time for model checking to pay back, and let testing enjoy the rich theory and applications of vacuity. We define and study vacuous satisfaction in the context of testing, and demonstrate how vacuity analysis can lead to better specifications and test suits.
UR - http://www.scopus.com/inward/record.url?scp=43149095153&partnerID=8YFLogxK
U2 - 10.1007/978-3-540-79124-9_2
DO - 10.1007/978-3-540-79124-9_2
M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???
AN - SCOPUS:43149095153
SN - 354079123X
SN - 9783540791232
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 4
EP - 17
BT - Tests and Proofs - Second International Conference, TAP 2008, Proceedings
PB - Springer Verlag
T2 - 2nd International Conference on Tests and Proofs, TAP 2008
Y2 - 9 April 2008 through 11 April 2008
ER -