Abstract
Considering the very recent interest in the flow between two sites on a percolation cluster it is obvious that an experimental study of such a problem requires local measurement techniques. Following this observation we report the first study of the voltage dependence of the images derived by contact-resistance atomic force microscopy (C-AFM) in general, and on a binary composite in particular. The results obtained provide an experimental map of the voltage dependence of the realized connectivity between a given pair of sites on a percolation cluster. Our measurements show that the two-dimensional cross-section images of a three-dimensional percolation cluster reveal a systematic behavior that can be described as a phase transition.
Original language | English |
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Pages (from-to) | 143-150 |
Number of pages | 8 |
Journal | Physica Status Solidi (B): Basic Research |
Volume | 230 |
Issue number | 1 |
DOIs | |
State | Published - 2002 |