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When AI Designs AI Hardware: Reliability Lessons from Accelerator Architectures

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Large language models (LLMs) are no longer limited to serving as software coding assistants. Recent work has explored translating design specifications and block-level functionality into synthesizable Verilog, while newer agentic systems attempt to extend this capability across increasingly larger portions of the hardware design flow, from specification and RTL generation through verification, physical design, and GDS generation. These approaches are attractive because they promise shorter development cycles and faster architectural exploration. Although conventional physical-design quality-of-results (QoR) metrics are often reported, reliability considerations remain largely outside the scope of such flows.This omission is particularly concerning for modern accelerators, whose dense datapaths, large memories, high switching activity, aggressive clock targets, and low-voltage operation make reliability a first-order design constraint. Aging-induced degradation, timing and voltage margins, IR drop, electromigration, and thermal effects interact across architecture, RTL design, synthesis, place-and-route, and signoff. Consequently, reliability depends on preserving context across abstraction layers rather than optimizing individual implementation stages in isolation. This paper discusses reliability pitfalls that can arise when LLM-driven accelerator design systems prioritize local correctness or stage-specific optimization while failing to maintain the cross-stage reasoning required for reliable silicon.

Original languageEnglish
Title of host publicationProceedings - 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2026
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331546854
DOIs
StatePublished - 2026
Event32nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2026 - Polignano a Mare, Italy
Duration: 1 Jul 20263 Jul 2026

Publication series

NameProceedings - 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2026

Conference

Conference32nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2026
Country/TerritoryItaly
CityPolignano a Mare
Period1/07/263/07/26

Bibliographical note

Publisher Copyright:
© 2026 IEEE.

Keywords

  • Accelerators
  • Agentic AI
  • Reliability

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