YBa2Cu3O7-x flux field penetration determined by acoustic emission data

E. Dul'kin; V. Beilin; E. Yashchin; M. Roth

doi:10.1088/0953-2048/15/7/317

YBa₂Cu₃O_7-x flux field penetration determined by acoustic emission data

E. Dul'kin^*, V. Beilin, E. Yashchin, M. Roth

^*Corresponding author for this work

Department of Applied Physics

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

We have studied YBa₂Cu₃O_7-x ceramic samples during current cycling at 77 K using an acoustic emission method. We have observed the acoustic emission impulses at a narrow region current value of ±0.5 A. These impulses are reasoned to be the flux-line motion penetration into the samples by the magnetic self-field. Based on an experimental current value and the size of the sample, this H₁ self-field value has been calculated to be 104 Oe. It is shown that the flux-line pinning process takes place most intensively in the narrow surface layer of a material.

Original language	English
Pages (from-to)	1081-1082
Number of pages	2
Journal	Superconductor Science and Technology
Volume	15
Issue number	7
DOIs	https://doi.org/10.1088/0953-2048/15/7/317
State	Published - Jul 2002

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@article{4aa90266aae6417b820a41a7234632fa,

title = "YBa2Cu3O7-x flux field penetration determined by acoustic emission data",

abstract = "We have studied YBa2Cu3O7-x ceramic samples during current cycling at 77 K using an acoustic emission method. We have observed the acoustic emission impulses at a narrow region current value of ±0.5 A. These impulses are reasoned to be the flux-line motion penetration into the samples by the magnetic self-field. Based on an experimental current value and the size of the sample, this H1 self-field value has been calculated to be 104 Oe. It is shown that the flux-line pinning process takes place most intensively in the narrow surface layer of a material.",

author = "E. Dul'kin and V. Beilin and E. Yashchin and M. Roth",

year = "2002",

month = jul,

doi = "10.1088/0953-2048/15/7/317",

language = "אנגלית",

volume = "15",

pages = "1081--1082",

journal = "Superconductor Science and Technology",

issn = "0953-2048",

publisher = "IOP Publishing Ltd.",

number = "7",

}

TY - JOUR

T1 - YBa2Cu3O7-x flux field penetration determined by acoustic emission data

AU - Dul'kin, E.

AU - Beilin, V.

AU - Yashchin, E.

AU - Roth, M.

PY - 2002/7

Y1 - 2002/7

N2 - We have studied YBa2Cu3O7-x ceramic samples during current cycling at 77 K using an acoustic emission method. We have observed the acoustic emission impulses at a narrow region current value of ±0.5 A. These impulses are reasoned to be the flux-line motion penetration into the samples by the magnetic self-field. Based on an experimental current value and the size of the sample, this H1 self-field value has been calculated to be 104 Oe. It is shown that the flux-line pinning process takes place most intensively in the narrow surface layer of a material.

AB - We have studied YBa2Cu3O7-x ceramic samples during current cycling at 77 K using an acoustic emission method. We have observed the acoustic emission impulses at a narrow region current value of ±0.5 A. These impulses are reasoned to be the flux-line motion penetration into the samples by the magnetic self-field. Based on an experimental current value and the size of the sample, this H1 self-field value has been calculated to be 104 Oe. It is shown that the flux-line pinning process takes place most intensively in the narrow surface layer of a material.

UR - http://www.scopus.com/inward/record.url?scp=0036639596&partnerID=8YFLogxK

U2 - 10.1088/0953-2048/15/7/317

DO - 10.1088/0953-2048/15/7/317

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:0036639596

SN - 0953-2048

VL - 15

SP - 1081

EP - 1082

JO - Superconductor Science and Technology

JF - Superconductor Science and Technology

IS - 7

ER -

YBa₂Cu₃O_7-x flux field penetration determined by acoustic emission data

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