Zero-Dimensional Cs 2 TeI 6 Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity

Yadong Xu, Bo Jiao, Tze Bin Song, Constantinos C. Stoumpos, Yihui He, Ido Hadar, Wenwen Lin, Wanqi Jie, Mercouri G. Kanatzidis*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

70 Scopus citations


We demonstrate a potential candidate, the 0D "all-inorganic" perovskite material Cs 2 TeI 6 , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs 2 TeI 6 consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs 2 TeI 6 film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 10 ω·cm. The resulting air- and water-stable Cs 2 TeI 6 device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm -1 . A high sensitivity for Cs 2 TeI 6 thick film device is realized, with the value of 192 nC·R -1 cm -2 under 40 kVp X-rays at an electrical field of 250 V·cm -1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs 2 TeI 6 perovskite films will require lower radiation doses in many medical and security check applications.

Original languageAmerican English
Pages (from-to)196-203
Number of pages8
JournalACS Photonics
Issue number1
StatePublished - 16 Jan 2019
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2018 American Chemical Society.


  • Cs TeI
  • electrostatic spray
  • hard radiation
  • perovskite
  • sensitivity
  • thick film


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