Zero-Dimensional Cs                         2                         TeI                         6                          Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity

Yadong Xu; Bo Jiao; Tze Bin Song; Constantinos C. Stoumpos; Yihui He; Ido Hadar; Wenwen Lin; Wanqi Jie; Mercouri G. Kanatzidis

doi:10.1021/acsphotonics.8b01425

Zero-Dimensional Cs ₂ TeI ₆ Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity

Yadong Xu, Bo Jiao, Tze Bin Song, Constantinos C. Stoumpos, Yihui He, Ido Hadar, Wenwen Lin, Wanqi Jie, Mercouri G. Kanatzidis^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

74 Scopus citations

Abstract

We demonstrate a potential candidate, the 0D "all-inorganic" perovskite material Cs ₂ TeI ₆ , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs ₂ TeI ₆ consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs ₂ TeI ₆ film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 ¹⁰ ω·cm. The resulting air- and water-stable Cs ₂ TeI ₆ device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm ^-1 . A high sensitivity for Cs ₂ TeI ₆ thick film device is realized, with the value of 192 nC·R ^-1 cm ^-2 under 40 kVp X-rays at an electrical field of 250 V·cm ^-1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs ₂ TeI ₆ perovskite films will require lower radiation doses in many medical and security check applications.

Original language	English
Pages (from-to)	196-203
Number of pages	8
Journal	ACS Photonics
Volume	6
Issue number	1
DOIs	https://doi.org/10.1021/acsphotonics.8b01425
State	Published - 16 Jan 2019
Externally published	Yes

Bibliographical note

Publisher Copyright:
© 2018 American Chemical Society.

Keywords

Cs TeI
electrostatic spray
hard radiation
perovskite
sensitivity
thick film

Access to Document

10.1021/acsphotonics.8b01425

Cite this

Xu, Y., Jiao, B., Song, T. B., Stoumpos, C. C., He, Y., Hadar, I., Lin, W., Jie, W., & Kanatzidis, M. G. (2019). Zero-Dimensional Cs ₂ TeI ₆ Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity. ACS Photonics, 6(1), 196-203. https://doi.org/10.1021/acsphotonics.8b01425

@article{0ca03f15bd85456b96bec1750edfbde0,

title = "Zero-Dimensional Cs 2 TeI 6 Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity",

abstract = " We demonstrate a potential candidate, the 0D {"}all-inorganic{"} perovskite material Cs 2 TeI 6 , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs 2 TeI 6 consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs 2 TeI 6 film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 10 ω·cm. The resulting air- and water-stable Cs 2 TeI 6 device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm -1 . A high sensitivity for Cs 2 TeI 6 thick film device is realized, with the value of 192 nC·R -1 cm -2 under 40 kVp X-rays at an electrical field of 250 V·cm -1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs 2 TeI 6 perovskite films will require lower radiation doses in many medical and security check applications.",

keywords = "Cs TeI, electrostatic spray, hard radiation, perovskite, sensitivity, thick film",

author = "Yadong Xu and Bo Jiao and Song, {Tze Bin} and Stoumpos, {Constantinos C.} and Yihui He and Ido Hadar and Wenwen Lin and Wanqi Jie and Kanatzidis, {Mercouri G.}",

note = "Publisher Copyright: {\textcopyright} 2018 American Chemical Society.",

year = "2019",

month = jan,

day = "16",

doi = "10.1021/acsphotonics.8b01425",

language = "אנגלית",

volume = "6",

pages = "196--203",

journal = "ACS Photonics",

issn = "2330-4022",

publisher = "American Chemical Society",

number = "1",

}

Xu, Y, Jiao, B, Song, TB, Stoumpos, CC, He, Y, Hadar, I, Lin, W, Jie, W & Kanatzidis, MG 2019, 'Zero-Dimensional Cs ₂ TeI ₆ Perovskite: Solution-Processed Thick Films with High X-ray Sensitivity', ACS Photonics, vol. 6, no. 1, pp. 196-203. https://doi.org/10.1021/acsphotonics.8b01425

TY - JOUR

T1 - Zero-Dimensional Cs 2 TeI 6 Perovskite

T2 - Solution-Processed Thick Films with High X-ray Sensitivity

AU - Xu, Yadong

AU - Jiao, Bo

AU - Song, Tze Bin

AU - Stoumpos, Constantinos C.

AU - He, Yihui

AU - Hadar, Ido

AU - Lin, Wenwen

AU - Jie, Wanqi

AU - Kanatzidis, Mercouri G.

PY - 2019/1/16

Y1 - 2019/1/16

N2 - We demonstrate a potential candidate, the 0D "all-inorganic" perovskite material Cs 2 TeI 6 , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs 2 TeI 6 consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs 2 TeI 6 film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 10 ω·cm. The resulting air- and water-stable Cs 2 TeI 6 device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm -1 . A high sensitivity for Cs 2 TeI 6 thick film device is realized, with the value of 192 nC·R -1 cm -2 under 40 kVp X-rays at an electrical field of 250 V·cm -1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs 2 TeI 6 perovskite films will require lower radiation doses in many medical and security check applications.

AB - We demonstrate a potential candidate, the 0D "all-inorganic" perovskite material Cs 2 TeI 6 , as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat-panel X-ray imagers. Cs 2 TeI 6 consists of high atomic number elements, has high electrical resistance, and exhibits high air and moisture stability, making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs 2 TeI 6 film can be prepared under a low-temperature process using electrostatic-assisted spray technique under atmospheric conditions and achieved resistivity of 4.2 × 10 10 ω·cm. The resulting air- and water-stable Cs 2 TeI 6 device exhibits a strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm -1 . A high sensitivity for Cs 2 TeI 6 thick film device is realized, with the value of 192 nC·R -1 cm -2 under 40 kVp X-rays at an electrical field of 250 V·cm -1 , which is ∼20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs 2 TeI 6 perovskite films will require lower radiation doses in many medical and security check applications.

KW - Cs TeI

KW - electrostatic spray

KW - hard radiation

KW - perovskite

KW - sensitivity

KW - thick film

UR - http://www.scopus.com/inward/record.url?scp=85060136845&partnerID=8YFLogxK

U2 - 10.1021/acsphotonics.8b01425

DO - 10.1021/acsphotonics.8b01425

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:85060136845

SN - 2330-4022

VL - 6

SP - 196

EP - 203

JO - ACS Photonics

JF - ACS Photonics

IS - 1

ER -